Staff Engineer in NAND Flash Process Integration
Samsung
08.2021 - Current
- Team : future device research lab at R&D center in Hwaseong
- Designing and evaluating structure of new VNAND cell for N+5 generation.
- Integrated RRAM(resistive RAM) based VNAND structure which has poly-silicon WL electrodes.
- Communicated with device analysts and process specialists, optimized next experiments.
- Integrated FeRAM(ferroelectric RAM) based VNAND structure and characterized its performances.