Research Associate
Reliability Research Center
04.2024 - 06.2024
- HTRB Reliability Testing
Performed high-temperature reverse bias testing on discrete power devices, evaluating thermal resistance and K-factor for junction temperature estimation.
Minseok Kim
Seoul
Work History
Education
M.S NBIT Convergence -
Korea University
Seoul 04.2001 -
B.S Electrical Engineering - Semiconductor-IP Advanced Track
Kookmin University
Seoul 04.2001 -
Academic Honors
- 2nd Place Poster Award, AVS 25th International Conference on Atomic Layer Deposition (ALD), June 22–25, 2025, Jeju, Korea
- Silver Prize, Creative Design Competition, College of Engineering, Kookmin University, June 2, 2023
Publications (SCI & SCIE Journals)
- First-author papers
Minseok Kim, Taeseok Kim, Jihoon Jeon, Gwang Min Park, Sung-Chul Kim, Sung Ok Won, Ryosuke Harada, Seong Keun Kim*
“Atomic layer growth of Pt films using dimethyl(N,N-dimethyl-3-butene-1-amine-N)platinum and O₃”
Applied Surface Science, 706, 163578 (2025).
- Co-author papers
Han Kim#, Taeseok Kim#, Minseok Kim, Jihoon Jeon, Gwang Min Park, Sung-Chul Kim, Sung Ok Won, Ryosuke Harada, Sangtae Kim, Seong Keun Kim*
“Selective Surface Passivation for Ultrathin and Continuous Metallic Films via Atomic Layer Deposition”
Nano Letters, 25, 4101 (2025).
CONFERENCES
- Minseok Kim, Han Kim, Taeseok Kim, Jihoon Jeon, Gwang Min Park, Sung-Chul Kim, Sung Ok Won, Ryosuke Harada, Sangtae Kim, Seong Keun Kim* “Selective Surface Passivation for Ultrathin and Continuous Metallic Films via Atomic Layer Deposition”
Poster Presentation, AVS 25th International Conference on Atomic Layer Deposition (ALD), Jeju, Korea, June 22–25, 2025
- Minseok Kim, Taeseok Kim, Han Kim, Seung Ho Ryu, Gwang Min Park, Sung-Chul Kim, Sung Kwang Lee, Taek-Mo Chung, Sung Ok Won, Jeong Hwan Han, Sangtae Kim, Seong Keun Kim*“Inhibitor-Assisted Atomic Layer Deposition for Uniformly Doped Ultrathin Films: Overcoming Compositional and Thickness Limitations”
Poster Presentation, Korean Conference on Semiconductors (KCS), Jeongseon, Korea, February 12–13, 2025.
Timeline
Research Associate
Reliability Research Center
04.2024 - 06.2024
M.S NBIT Convergence -
Korea University
04.2001 -
B.S Electrical Engineering - Semiconductor-IP Advanced Track
Kookmin University
04.2001 -
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