Seung Je Moon

- Project Manager in the Yield Enhancement (YE) Team at Samsung Foundry, responsible for yield optimization in advanced logic nodes

- Led mass production yield analysis and prediction for 3nm GAA and 4/5nm FinFET logic products

- Developed and implemented defect & performance BKM with a focus on long-term yield improvement

- Conducted FMEA and YTS trend analysis for process control and risk mitigation

- Identified low-yield root causes, verified improvement effectiveness, and established management standards

- Analyzed process vulnerabilities, managed ramp-up risks, and supported stable high-volume manufacturing

- Delivered internal training sessions on yield forecasting and data analysis

- QRA & PTF Analysis Group

- Led failure analysis and diagnostic design across technologies and product families

- Conducted static and dynamic fault isolation using OBIRCH, TIVA, EMMI, SDL, JTAG, BIST, and scan chain debug

- Performed physical FA using Meridian IV, SOM4000/5000, FIB, SEM, TEM, CSAM, and X-ray (2D/3D)

- Analyzed GDS layouts (Camelot), test datalogs, and wafer maps to determine root causes of functional and structural failures

- Presented findings and corrective actions to internal teams and global customers

- Designed and validated debug methods for ATE bench systems