Analytical and detail-oriented M.S. researcher with hands-on experience in nanoscale characterization and process optimization of N-doped carbon dot TFTs. Proficient in thin film metrology using SEM, AFM, and XRD, and skilled in troubleshooting and interpreting nanoscale data. Experienced in yield analysis using the Commonality method, and proposing improvement plans based on statistical insights. Proven leadership from managing high-pressure operations at McDonald’s, with a strong customer-focused mindset.